MIL-DTL-2212K(SH)
4.6.14 EMI. The emission and susceptibility tests (CE101, CE102, CS101, CS114, CS116, RE101, RE102,
RS101, RS103) as required by MIL-STD-461 as specified in 3.17.8 of this document shall be performed to
determine electromagnetic compliance (EMC). In addition, the following DOD-STD-1399-70-1 test shall be
performed to simulate extreme magnetic conditions that can be present. The energized device shall be subjected to a
high current field of 500 ampere/foot. The field shall be applied in each axis (top, bottom, left, right, front, and
back). During testing, the device shall be constantly polled via the network interface and all input and outputs
monitored. There shall be no error in the data stream or unexpected change in state of the device (see 3.17.8).
4.6.15 Time delay setpoint repeatability. Time delay relays shall be set at 5, 20, 40, 60, 80, and 95 percent of
their timing range. At each setting, the relay will be operated five times. Performance shall conform to the
requirements of 3.16.4.3.
4.6.16 Recycle time of time delay relay. Time delay relay shall be set at 80 percent of their timing range and
operated five times to establish an average reference time delay. To test the relay, the control voltage shall be
interrupted for 75 milliseconds and then restored. Performance shall be the average of at least five operations for
each condition. Performance shall conform to 3.16.4.3.
a. Interruption immediately following the timing interval. The subsequent time delay shall be at least
90 percent of the reference time delay.
b. Interruption during (30 to 70 percent of the set time delay) timing. The subsequent time delay shall be at
least 80 percent of the reference time delay.
4.6.17 Steady-state voltage and frequency tolerance test for solid-state devices. Equipment shall pass an
examination and general operation test (see 4.5) in each of the conditions A through F as specified in table XIV.
See MIL-STD-1399-300 for limits.
TABLE XIV. Steady-state voltage and frequency tolerance test for solid-state devices.
Voltage
Frequency
Condition
Lower limit
Normal
Upper limit
Lower limit
Normal
Upper limit
A (Reference
Nominal
6.0
measurement)
-5% (3 ph)
B
58.2
-10% (1 ph)
+5% (3 ph)
C
58.2
+10% (1 ph)
+5% (3 ph)
D
61.8
+10% (1 ph)
-5% (3 ph)
E
61.8
-10% (1 ph)
F
-10% (1 ph)
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4.6.18 Transient voltage and frequency tolerance and recovery test for solid-state devices. Equipment shall not
malfunction or change state of operation when tested as specified in 4.6.18.1 through 4.6.18.2. Equipment shall be
tested in both the energized and de-energized operational modes. Equipment with more than one energized
operational mode shall be operated in the mode selected by the testing activity to be the most likely to be affected by
the test conditions and the mode used predominantly in service. See MIL-STD-1399-300 for limits.
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